Title

Instability of Kinetic Roughening in Sputter-Deposition Growth of Pt on Glass

Document Type

Article

Publication Date

1996

Abstract

Using scanning tunneling microscopy, we have studied the kinetic roughening in the growth of Pt sputter deposited on glass at room temperature for a film thickness range of 15–140 nm. The growth exhibits an irregularly growing mound morphology and shows an instability with anomalous scaling behavior characterized by the √ ln ( t ) dependence of the local slope, where t is the growth time, and also by the roughness exponent α ≃ 0.9 and interface growth exponent β ≃ 0.26 . These characteristics clearly indicate that the growth is consistent with a statistical model of linear diffusion dynamics.

Recommended Citation

Jeffries, J. H., J-K. Zuo, and M. M. Craig. "Instability of kinetic roughening in sputter-deposition growth of Pt on glass." Physical review letters 76, no. 26 (1996): 4931.

DOI for the article

10.1103/physrevlett.76.4931

Department

Biomedical Sciences

Share

COinS