Quasicrystalline phase of silicon on glass

Abstract

In this paper, we report new phase of crystalline silicon, quasicrystalline silicon thin-film on glass substrate. The surface topography of these films reveal simultaneous existence of sixfold and fivefold symmetry. We found an array of quasi-unit cell in 2-D that formed quasicrystalline solid. This is first time demonstration of quasicrystalline for single element, silicon (Si). Raman spectra suggests that we found crystalline silicon structure on glass substrate that is not single-crystal silicon (c-Si) but very close to c-Si.

Department(s)

Physics, Astronomy, and Materials Science

Document Type

Conference Proceeding

DOI

https://doi.org/10.1557/opl.2013.225

Keywords

chemical vapor deposition (CVD) (deposition), crystallographic structure, quasicrystal

Publication Date

11-20-2013

Journal Title

Materials Research Society Symposium Proceedings

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