Title

XAFS and X-ray reflectivity studies of buried interfaces

Abstract

Many of the properties of materials are not due to single-crystal properties, but rather the structure and behavior of internal interfaces. Unlike a free surface, however, there are few ways to nondestructively probe these "buried" interfaces. Here, results are presented on several systems, including semiconductor heterointerfaces exhibiting complex reconstruction, and internal interfaces in metals and semiconductors showing anisotropic atomic motion. In discussing these results, it is shown how X-ray Absorption Fine-structure Spectroscopy (XAFS), X-ray diffraction, and X-ray reflectivity measurements complement one another.

Department(s)

Physics, Astronomy, and Materials Science

Document Type

Article

DOI

https://doi.org/10.1016/S0168-583X(97)00469-2

Publication Date

12-2-1997

Journal Title

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

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