XAFS studies of diluted magnetic semiconductors Zn1-xMxS (M = Mn, Co)
Abstract
X-ray absorption near edges structure (XANES) spectra of the Diluted Magnetic Semiconductors (DMS) system Zn1-xMxS (M=Mn, Co) have been measured at the Mn and Co L3.2-edge using sample current mode. Analysis of the M L3.2-edge XANES spectra for Zn1-xMxS revealed the presence of a white line feature in each series, whose intensity increased linearly with concentration x. The white line feature is assigned to M 2p3/2 and 2p1/2 photoelectron excitations to nonbonding 3d(e) states and to the relatively broadened band of M 3d(t2) - S 3p hybridized antibonding states. The rate of increase of L3,2 white line intensity with x is associated with the difference in the degree of p-d hybridization of states between M 3d and S 3p.
Department(s)
Physics, Astronomy, and Materials Science
Document Type
Article
DOI
https://doi.org/10.1051/jp4:19972166
Publication Date
1-1-1997
Recommended Citation
Pong, Way Faung, Robert A. Mayanovic, J. K. Kao, H. H. Hsieh, J. Y. Pieh, Y. K. Chang, K. C. Kuo, P. K. Tseng, and J. F. Lee. "XAFS studies of diluted magnetic semiconductors Zn1-xMxS (M= Mn, Co)." Le Journal de Physique IV 7, no. C2 (1997): C2-1147.
Journal Title
Journal De Physique. IV : JP
