Title
XAFS studies of diluted magnetic semiconductors Zn1-xMxS (M = Mn, Co)
Abstract
X-ray absorption near edges structure (XANES) spectra of the Diluted Magnetic Semiconductors (DMS) system Zn1-xMxS (M=Mn, Co) have been measured at the Mn and Co L3.2-edge using sample current mode. Analysis of the M L3.2-edge XANES spectra for Zn1-xMxS revealed the presence of a white line feature in each series, whose intensity increased linearly with concentration x. The white line feature is assigned to M 2p3/2 and 2p1/2 photoelectron excitations to nonbonding 3d(e) states and to the relatively broadened band of M 3d(t2) - S 3p hybridized antibonding states. The rate of increase of L3,2 white line intensity with x is associated with the difference in the degree of p-d hybridization of states between M 3d and S 3p.
Department(s)
Physics, Astronomy, and Materials Science
Document Type
Article
DOI
https://doi.org/10.1051/jp4:19972166
Publication Date
1-1-1997
Recommended Citation
Pong, Way Faung; Mayanovic, Robert A.; Kao, J. K.; Hsieh, H. H.; Pieh, J. Y.; Chang, Y. K.; Kuo, K. C.; Tseng, P. K.; and Lee, J. F., "XAFS studies of diluted magnetic semiconductors Zn1-xMxS (M = Mn, Co)" (1997). Articles by College of Natural and Applied Sciences Faculty. 2158.
https://bearworks.missouristate.edu/articles-cnas/2158
Journal Title
Journal De Physique. IV : JP
