Title

Local order and bonding primarily using EXAFS and SEXAFS

Abstract

An overview of the applications of extended X-ray absorption fine structure (EXAFS) and surface EXAFS (SEXAFS) techniques to the study of local structure of surfaces and interfaces is presented. Data collection techniques are discussed and evaluated and methods of data analysis are outlined. Studies of adsorbed atoms and molecules resulting from reactions between gases and solid surfaces and liquids and solid surfaces are reviewed. Works on shallow and buried metal-metal, metal-semiconductor, and semiconductor-semiconductor interfaces are also critically examined. Special attention is paid to relevance these studies may have to current technology concerns of our society. Some recent developments and future trends in the field are also discussed.

Department(s)

Physics, Astronomy, and Materials Science

Document Type

Article

Publication Date

1-1-1993

Journal Title

Critical Reviews in Surface Chemistry

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