Ion beam modification and analysis of metal/polymer bi-layer thin films
A set of varying-thickness Au-films were thermally evaporated onto poly(styrene-co-acrylonitrile) thin film surfaces. The Au/PSA bi-layer targets were then implanted with 50 keV N+ ions to a fluence of 1 × 1016 ions/cm2 to promote metal-to-polymer adhesion and to enhance their mechanical and electrical performance. Electrical conductivity measurements of the implanted Au/PSA thin films showed a sharp percolation behavior versus the pre-implant Au-film thickness with a percolation threshold near the nominal thickness of 44 Å. The electrical conductivity results are discussed along with the film microstructure and the elemental diffusion/mixing within the Au/PSA interface obtained by scanning electron microscopy (SEM) and ion beam analysis techniques (RBS and ERD). © 2004 Elsevier B.V. All rights reserved.
Center for Applied Science and Engineering
Physics, Astronomy, and Materials Science
Electrical conductivity, Ion Implantation, Metal/polymer interface, Microstructure, RBS/ERD, SEM
Wang, Y. Q., M. Curry, E. Tavenner, N. Dobson, and R. E. Giedd. "Ion beam modification and analysis of metal/polymer bi-layer thin films." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 219 (2004): 798-803.
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms