Thesis Title

Photoreflectance and Its Application to Semiconductor Characterization

Author

Jianrong Lin

Date of Graduation

Fall 1998

Degree

Master of Science in Materials Science

Department

Physics, Astronomy, and Materials Science

Committee Chair

Shyang Hwang

Subject Categories

Materials Science and Engineering

Abstract

A photoreflectance measurement system has been designed and implemented. The system provides a sensitive, accurate, and nondestructive means for the study and characterization of semiconductors. The system includes a microcontroller-based servomechanism to drive a variable neutral density filter for signal normalization. System performance under different conditions has been investigated. The methods to suppress the noise in the measurement are examined. The prototype system has been successfully applied to the characterization of CdTe, semi-insulating GaAs, and GaAs thin films grown on semi-insulating GaAs and Si-doped GaAs in the molecular beam eptaxial system.

Copyright

© Jianrong Lin

Citation-only

Dissertation/Thesis

Share

COinS