Effects of annealing process on morphology, crystal structure, and photoelectrical properties of CZTS thin films

Abstract

In this paper, Cu2ZnSnS4 (CZTS) thin films were directly formed on FTO glass substrates by a simple ethanol-thermal method, and the films were annealed at 550 oC under different atmospheric environments. Field emission scanning electron microscopy, energy dispersive spectroscopy, X-ray powder diffraction, and photoelectrical measurements were conducted to investigate effects of annealing parameters on surface morphology, chemical compositions, crystal structures, and photoelectrical properties of the thin films. All the thin films were smooth and compact, but their color and micro-topography varied due to the different annealing atmospheres employed. The addition of sulfur during the annealing process is necessary to tailor sulfur concentration in the films with the crystallization of the CZTS phase.

Department(s)

Physics, Astronomy, and Materials Science

Document Type

Conference Proceeding

DOI

https://doi.org/10.1149/06106.0081ecst

Publication Date

1-1-2014

Journal Title

ECS Transactions

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