Ion Beam Mixing of Metal/Fluoropolymer Interfaces
Date of Graduation
Master of Science in Materials Science
Physics, Astronomy, and Materials Science
Materials Science and Engineering
The adhesion of metals to polymers depends on the structure at the interface. In this work, we study the "mixing' effect of 50 keV nitrogen implanted thin metal layers on Teflon PTFE (polytetrafluoroethylene). RBS analysis shows that thin layers copper and chromium approximately 300-400 Å thick become distributed though the implant layer of the Teflon. When the implant fluence increases the metal is distributed over a small range deep into the implant layer. In situ RGA analysis during the implantation process shows the liberation of an abundance of fluorine in many different forms. This is supported by results from a NRA that shows the non-uniform density profile of fluorine throughout the implant layers. During the implantation process, the fluorine is released through the incident ion track leaving a carbon and metal rich region near the surface of the implant layer. The fluorine density increases with depth through the implant layer.
© Darcie LeAnn Dennis
Dennis, Darcie LeAnn, "Ion Beam Mixing of Metal/Fluoropolymer Interfaces" (1998). MSU Graduate Theses. 847.