Abstract
Using scanning tunneling microscopy, we have studied the kinetic roughening in the growth of Pt sputter deposited on glass at room temperature for a film thickness range of 15–140 nm. The growth exhibits an irregularly growing mound morphology and shows an instability with anomalous scaling behavior characterized by the √ ln ( t ) dependence of the local slope, where t is the growth time, and also by the roughness exponent α ≃ 0.9 and interface growth exponent β ≃ 0.26 . These characteristics clearly indicate that the growth is consistent with a statistical model of linear diffusion dynamics.
Department(s)
Physics, Astronomy, and Material Science
Biomedical Sciences
Document Type
Article
DOI
https://doi.org/10.1103/physrevlett.76.4931
Rights Information
© 1996 The American Physical Society
Publication Date
1996
Recommended Citation
Jeffries, J. H., J-K. Zuo, and M. M. Craig. "Instability of kinetic roughening in sputter-deposition growth of Pt on glass." Physical review letters 76, no. 26 (1996): 4931.
Journal Title
Physical review letters
