Abstract
The surface topography and electronic structure of sulfur-modified nanocrystalline carbon films were investigated. Using topographic image analysis it was observed that the root-mean-square roughness of the film surface and average grain size decreased with increasing sulfur incorporation either in gas or solid films. The Fermi level for undoped nanocrystalline carbon (n-C) was found just below the midgap which indicated that n-C is a weakly p-type semiconductor. The results show oscillatory behavior or peaks which was ascribed to states of the surface layer having relatively more graphitic or sp 2-bonded carbon bonds.
Department(s)
Physics, Astronomy, and Materials Science
Document Type
Article
DOI
https://doi.org/10.1063/1.1888025
Rights Information
© 2005 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Journal of Applied Physics and may be found at https://doi.org/10.1063/1.1888025.
Publication Date
5-1-2005
Recommended Citation
Gupta, S., B. R. Weiner, and G. Morell. "Electronic structure of sulfur-modified nanocrystalline carbon films." Journal of applied physics 97, no. 9 (2005): 094307.
Journal Title
Journal of Applied Physics
