Vertical exchange bias effects in multilayer thin films based on iron oxide and chromium oxide

Abstract

Multilayer thin films based on iron oxide and chromium oxide are grown using pulsed laser deposition technique. Structural, electrical, and magnetic properties of the multilayer films are studied in detail. X-ray diffraction analysis shows the polycrystalline nature of chromium oxide films, while iron oxide shows strong orientation along (222) direction. Temperature dependent electrical measurements show semiconducting nature of the film. These multilayer films show magneto-resistance (MR) of about 1.4% at 1 T field. Zero field cool and field cool magnetization (M) vs. magnetic field (H) studies clearly show the presence of vertical exchange bias effect. This vertical exchange bias effect decreases with increase in temperature and vanishes at room temperature.

Department(s)

JVIC-Center for Biomedical and Life Sciences
Physics, Astronomy, and Materials Science

Document Type

Article

DOI

https://doi.org/10.1016/j.matlet.2011.05.049

Keywords

Chromium oxide, Ferromagnetic, Iron oxide, Multilayer, Vertical exchange bias

Publication Date

8-1-2011

Journal Title

Materials Letters

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