An algorithm using LSP to find symmetric axes of chromosomes

Abstract

Chromosomes are the primary objects studied in cytogenetics. Recent efforts have been devoted to automating the analysis of banded metaphase chromosomes. Feature extraction is the first step to identify a chromosome. Many useful features, such as the length and the number of bands of a chromosome, can be measured along with the chromosome's longitudinal symmetric axis. Therefore, finding this axis is a necessary precursor to making those measurements. In this paper, a new algorithm for finding a symmetric axis of a chromosome is discussed. The author introduced a concept of "local symmetric property" of an oblong object, and, then, applied this concept to a chromosome to find the symmetric axis after the boundary of the chromosome has been found. The results of the experiments show that the algorithm works well for both straight and bent chromosomes. Since the algorithm is based on the geometric properties of an object rather than its biological properties, it also can be used to find the symmetric axis of any other oblong object.

Department(s)

Computer Science

Document Type

Conference Proceeding

DOI

https://doi.org/10.1117/12.449779

Keywords

Chromosomes, Feature extraction, Image analysis, Karyogram, Karyotyping

Publication Date

12-1-2001

Journal Title

Proceedings of SPIE - The International Society for Optical Engineering

Link to Full Text

Share

COinS