Effect of oxygen partial pressure on structural, optical and electrical properties of titanium-doped CdO thin films

Abstract

Titanium-doped CdO thin films were deposited on quartz by pulsed laser deposition. The effect of oxygen partial pressure on optoelectrical properties of these films was studied. It is observed that surface roughness of the films depends on oxygen partial pressure. The root mean square values of surface roughness for the films grown under different oxygen pressure were found to vary from 0.55 to 2.95 nm. Highly conducting (4.41 × 104 S/cm), and transparent (∼78%) film with high mobility (120 cm2 V−1 s−1) is observed for the film grown under oxygen pressure of 1.0 × 10−3 mbar. The optical band gap is found varying between 2.45 and 2.67 eV for various oxygen pressure.

Department(s)

Physics, Astronomy, and Materials Science

Document Type

Article

DOI

https://doi.org/10.1016/j.apsusc.2008.07.102

Keywords

cadmium oxide, pulsed laser deposition, transparent electrode, hall effect, mobility

Publication Date

2008

Journal Title

Applied surface science

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